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With bias, solving the BTE, we get a displaced Maxwellian or drifted Maxwellian: kd)2 j hk2m _~c { EF- Lc

Figure 1.40 S parameters after input and output impedances are matched by parts. (The intermediate frequency f = 3.96 GHz is marked by a dot on each trace.) At input: CP,in = 0.3 pF, LS,in = 3.3 nH. At output: LP,out = 5 nH, CS,out = 0.13 pF, and CP,out = 0.3 pF.

(8.37) is the steering matrix . Additionally, we assume that the noise at the different antenna elements is independent (spatially 2 white), so that the correlation matrix of the noise is a diagonal matrix with entries n on the main diagonal.

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Perhaps the most critical decision in any modeling effort is the intended level of detail. Too much detail, and you will never complete the model or get your hands on the data to drive it. Too little detail, and the model doesn t tell you anything that you didn t tell it to tell you, as Jerry Brashear would say. Daniel describes the approach nally arrived at:1 At Shell, the stochastic library had to be assembled from vast amounts of data gathered world-wide. The first decision was the level of granularity at which to model projects. The level chosen was the exploration venture, which included a number of projects within a single geographical region. The next problem is that, just as Eskimos have no word for snow but rather many words to describe various forms of frozen water, oil companies have no word for oil. The model needed to re ect numerous metrics for oil in various states of discovery, such as the oil in Region 6 that you haven t discovered yet, the oil you have discovered but haven t gured out how to extract, and so on. Furthermore, multiple time periods needed to be modeled. As a result, there was no simple two-dimensional ef cient frontier, as shown in Figure 29.2. Instead, in choosing the portfolio, management needed to visualize a large number of trade-offs that evolved through time.

d1 = 3000

GRAZING-INCIDENCE X-RAY SPECTROMETRY Another possible method for reducing the background and improving the detection limit is to use polarized radiation in order to decrease the scattered X-rays When the primary beam has a linear polarization and the detector is placed in the plane of the polarization vector, the scattering intensity is proportional to 2 cos2 (r/R)2 + sin2 (r/R)4 , while uorescent X-rays are simply linear to (r/R)2 , where r and R are the detector radius and the distance from the beam to the center of the detector, respectively, and is the scattering angle (the angle between the primary and scattering beams)18 This means when approaches 90 , by reducing the solid angle of the detector, the ratio of uorescent and scattering intensity can be improved The advent of the synchrotron radiation (SR) source has had an extremely signi cant impact on the development of the TXRF technique.

This Xray source has unique properties, such as a high intensity, a very low angular divergence, energy tunability, and a high degree of linear polarization Following the rst experiment performed in Japan,19 a number of TXRF studies have been done using SR at almost all facilities worldwide One of the most important applications is the ultra trace determination of the surface contamination of semiconductor wafers In the late 1990s, a detection limit in the order of 108 atoms/cm2 was achieved for transition metals at Hamburg (HASYLAB/DESY), Stanford (SSRL) and Tsukuba (Photon Factory) At that time, such a trace level was almost the limit for other promising forms of chemical analysis, such as inductively coupled plasma mass spectrometry (ICP-MS) and atomic absorption spectroscopy (AAS), and therefore the detection power of SR-TXRF was a breakthrough.

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